Film Frame Test Handler '4170-IH'
Improved transport accuracy and load capacity of the measurement table! Compatible with WLCSP, multi-site, and batch contact.
The "4170-IH" is a film frame test handler that tests leadless devices such as QFN and CSP directly on the wafer after dicing. By performing visual position correction (xyzθ) before measurement, accurate position information of the device and optimal probe pin pressure are maintained across all devices on the strip, achieving stable measurements and high-speed indexing. 【Features】 ■ High throughput ■ High load capacity, high thrust table ■ Expanded strip attachment area - Within 260mm in length × 300mm in width (WLCSP within φ300mm) ■ LOT management compatible with barcode/2D code reader ■ Switching between varieties is a simple exchange involving only the measurement socket replacement and screen settings. *The downloadable PDF material is the English version of the catalog. For more details, please refer to the PDF material or feel free to contact us.
- Company：テセック
- Price：Other
